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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Videometrics, Range Imaging, and Applications XIII - DTM generation from STC-SIMBIO-SYS images
Remondino, Fabio, Shortis, Mark R., Re, C., Simioni, E., Cremonese, G., Roncella, R., Forlani, G., Da Deppo, Vania, Naletto, G., Salemi, G.Volume:
9528
Year:
2015
Language:
english
DOI:
10.1117/12.2184745
File:
PDF, 6.34 MB
english, 2015