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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Applying of digital signal processing to optical equisignal zone system
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Maraev, Anton A., Timofeev, Aleksandr N., Gusarov, Vadim F.Volume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184918
File:
PDF, 449 KB
english, 2015