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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII - Impact of thermal treatment on electrical characteristics and charge collection efficiency of Me-GaAs:Cr-Me x-ray sensors
Franks, Larry, James, Ralph B., Fiederle, Michael, Burger, Arnold, Novikov, V., Zarubin, A., Tolbanov, O., Tyazhev, A., Lozinskaya, A., Budnitsky, D., Skakunov, M.Volume:
9593
Year:
2015
Language:
english
DOI:
10.1117/12.2187181
File:
PDF, 536 KB
english, 2015