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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII - Addressing the problem of glass thickness variation in the indirect slumping technology
O'Dell, Stephen L., Pareschi, Giovanni, Proserpio, Laura, Wellnhofer, Christoph, Breunig, Elias, Friedrich, Peter, Winter, AnitaVolume:
9603
Year:
2015
Language:
english
DOI:
10.1117/12.2188026
File:
PDF, 3.25 MB
english, 2015