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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Polarization Science and Remote Sensing VII - Polarization-based complex index of refraction estimation with diffuse scattering consideration
Shaw, Joseph A., LeMaster, Daniel A., Zhan, Hanyu, Voelz, David G., Xiao, Xifeng, Cho, Sang-YeonVolume:
9613
Year:
2015
Language:
english
DOI:
10.1117/12.2188281
File:
PDF, 381 KB
english, 2015