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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Polarization Science and Remote Sensing VII - Ray tracing based path-length calculations for polarized light tomographic imaging
Shaw, Joseph A., LeMaster, Daniel A., Manjappa, Rakesh, Kanhirodan, RajanVolume:
9613
Year:
2015
Language:
english
DOI:
10.1117/12.2189190
File:
PDF, 185 KB
english, 2015