SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - A novel scanning system using an industrial robot and the workspace measurement and positioning system
Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Zhao, Ziyue, Zhu, Jigui, Yang, Linghui, Lin, JiaruiVolume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2199311
File:
PDF, 497 KB
english, 2015