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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - Comparisons between real and complex Gauss wavelet transform methods of three-dimensional shape reconstruction
Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Xu, Luopeng, Dan, Youquan, Wang, QingyuanVolume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2199800
File:
PDF, 739 KB
english, 2015