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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Image Processing and Analysis - Study on high resolution and high repeatability target localization algorithm in development of national level standard
Shen, Chunhua, Yang, Weiping, Liu, Honghai, Huang, Yao, Wang, Weichen, Xue, ZiVolume:
9675
Year:
2015
Language:
english
DOI:
10.1117/12.2203028
File:
PDF, 518 KB
english, 2015