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SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 13 February 2016)] Laser-based Micro- and Nanoprocessing X - Surface treatment with small laser spots: an approach for the comparison of process parameters
Klotzbach, Udo, Washio, Kunihiko, Arnold, Craig B., Kreling, Stefan, Grefe, Hinrich, Dilger, KlausVolume:
9736
Year:
2016
Language:
english
DOI:
10.1117/12.2212547
File:
PDF, 715 KB
english, 2016