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SPIE Proceedings [SPIE Microelectronic Manufacturing '95 - Austin, TX, United States (Wednesday 25 October 1995)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis - Laser heterostructures reliability analysis by recombination parameter of cleaved surfaces
Sverdlov, Mikhail I., Anisimova, Ludmila T., Ovchinnikova, Natalja N., Philipchenko, Vladimir J., Yakorev, Serguej N.Volume:
2635
Year:
1995
Language:
english
DOI:
10.1117/12.221441
File:
PDF, 27 KB
english, 1995