![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Developments in X-Ray Tomography VI - Metrology with μCT: precision challenge
Suppes, Alexander, Stock, Stuart R., Neuser, EberhardVolume:
7078
Year:
2008
Language:
english
DOI:
10.1117/12.793776
File:
PDF, 681 KB
english, 2008