SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Developments in X-Ray Tomography VI - Phase-contrast imaging and tomography at 60 keV using a conventional x-ray tube
Donath, T., Stock, Stuart R., Pfeiffer, F., Bunk, O., Groot, W., Bednarzik, M., Grünzweig, C., Hempel, E., Popescu, S., Hoheisel, M., David, C.Volume:
7078
Year:
2008
Language:
english
DOI:
10.1117/12.794699
File:
PDF, 402 KB
english, 2008