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SPIE Proceedings [SPIE International Symposium on Optomechatronic Technologies - San Diego, CA (Monday 17 November 2008)] Optomechatronic Technologies 2008 - Object recognition based on relationship between camera vibration and measurement error on stereo measurement
Otani, Yukitoshi, Okazaki, Shin'ya, Tanaka, Takayuki, Bellouard, Yves, Wen, John T., Kaneko, Shun'ichi, Takauji, Hidenori, Hodko, Dalibor, Katagiri, Yoshitada, Kassegne, Samuel K., Kofman, Jonathan, KVolume:
7266
Year:
2008
Language:
english
DOI:
10.1117/12.807265
File:
PDF, 1.04 MB
english, 2008