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Localization of chemical elements and isotopes in the leaf of soybean (Glycine max) by secondary ion mass spectrometry microscopy: critical choice of sample preparation procedure
N. Grignon, S. Halpern, J. Jeusset, C. Briançon, P. FraguVolume:
186
Year:
1997
Language:
english
Pages:
16
DOI:
10.1046/j.1365-2818.1997.1850747.x
File:
PDF, 1.68 MB
english, 1997