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[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Using spline-function for the reason unceasing description of the metrological features of the measures ORF
Sibirtsev, S.N., Romasko, S.V., Palchun, A.Yu.Year:
2014
DOI:
10.1109/apeie.2014.7040888
File:
PDF, 909 KB
2014