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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Design of monitored self-checking sequential circuits for enhanced fault models
Parekhji, R.A., Venkatesh, G., Sherlekar, S.D.Year:
1993
DOI:
10.1109/ats.1993.398821
File:
PDF, 541 KB
1993