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[IEEE 2015 International Conference on Embedded Software (EMSOFT) - Amsterdam, Netherlands (2015.10.4-2015.10.9)] 2015 International Conference on Embedded Software (EMSOFT) - Requirements driven falsification with coverage metrics

Dokhanchi, Adel, Zutshi, Aditya, Sriniva, Rahul T., Sankaranarayanan, Sriram, Fainekos, Georgios
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Year:
2015
DOI:
10.1109/emsoft.2015.7318257
File:
PDF, 1.08 MB
2015
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