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[IEEE 2015 International EURASIP Workshop on RFID Technology (EURFID) - Rosenheim, Germany (2015.10.22-2015.10.23)] 2015 International EURASIP Workshop on RFID Technology (EURFID) - A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect
Vales-Alonso, Javier, Munoz-Gea, Juan Pedro, Alcaraz, Juan J.Year:
2015
DOI:
10.1109/eurfid.2015.7332384
File:
PDF, 121 KB
2015