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Confocal microscopy and spectroscopy of InGaN epilayers on sapphire
O'DONNELL, TOBIN, BAYLISS, VAN DER STRICHTVolume:
193
Year:
1999
Language:
english
Pages:
4
DOI:
10.1046/j.1365-2818.1999.00449.x
File:
PDF, 598 KB
english, 1999