Nano-slit probes for near-field optical microscopy fabricated by focused ion beams
H. U. Danzebrink, TH. Dziomba, T. Sulzbach, O. Ohlsson, C. Lehrer, L. FreyVolume:
194
Year:
1999
Language:
english
Pages:
5
DOI:
10.1046/j.1365-2818.1999.00505.x
File:
PDF, 264 KB
english, 1999