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[IEEE 2014 International Conference on Electrical, Electronics and System Engineering (ICEESE) - Kuala Lumpur (2014.12.9-2014.12.10)] 2014 2nd International Conference on Electrical, Electronics and System Engineering (ICEESE) - A study of drain current in presence of hot carrier effect for sub-micron MOS devices
Kumar, B. Naresh, Singh, Ajay Kumar, Prabhu, C. M. R.Year:
2014
DOI:
10.1109/iceese.2014.7154571
File:
PDF, 2.17 MB
2014