Grain size distribution analysis in polycrystalline LiF...

Journal of Microscopy 2000 Vol. 197; Iss. 3

Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data

Cremona, Mauricio, Scavarda Do Carmo, Prioli, Nunes, Zanette, Caride, Albuquerque
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Volume:
197
Year:
2000
Language:
english
Pages:
8
DOI:
10.1046/j.1365-2818.2000.00661.x
File:
PDF, 366 KB
english, 2000
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