[IEEE 2008 International Conference on Machine Learning and...

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[IEEE 2008 International Conference on Machine Learning and Cybernetics (ICMLC) - Kunming, China (2008.07.12-2008.07.15)] 2008 International Conference on Machine Learning and Cybernetics - Research and design of digital validation image recognition algorithm based on contour features

Chun-Ying Kang,, Wei Zhang,, Tao Zhang,
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Year:
2008
DOI:
10.1109/icmlc.2008.4620925
File:
PDF, 317 KB
2008
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