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[IEEE 2008 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Nanjing, China (2008.04.21-2008.04.24)] 2008 International Conference on Microwave and Millimeter Wave Technology - The new fiber-optic stain sensor
Liu Yunjing,, Wang Xueguang,Year:
2008
DOI:
10.1109/icmmt.2008.4540527
File:
PDF, 462 KB
2008