[IEEE 2015 IEEE Metrology for Aerospace (MetroAeroSpace) -...

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[IEEE 2015 IEEE Metrology for Aerospace (MetroAeroSpace) - Benevento, Italy (2015.6.4-2015.6.5)] 2015 IEEE Metrology for Aerospace (MetroAeroSpace) - Environmental tests and optical measurements in the validation process of TFT-LCD for avionics applications

Catelani, Marcantonio, Ciani, Lorenzo, Venzi, Matteo, Barile, Giovanni
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Year:
2015
DOI:
10.1109/metroaerospace.2015.7180694
File:
PDF, 480 KB
2015
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