Analytical electron microscopy and focused ion beam:...

Analytical electron microscopy and focused ion beam: complementary tool for the imaging of copper sorption onto iron oxide aggregates

D. Mavrocordatos, M. Steiner, M. Boller
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Volume:
210
Year:
2003
Language:
english
Pages:
8
DOI:
10.1046/j.1365-2818.2003.01168.x
File:
PDF, 344 KB
english, 2003
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