[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Simulation tool for scanning x-ray beams irradiator
Lazurik, V.T., Lazurik, V.M., Popov, G.F., Rogov, Yu.V.Volume:
3
Year:
2003
DOI:
10.1109/pac.2003.1288613
File:
PDF, 231 KB
2003