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[IEEE 2006 Technology Management for the Global Future - PICMET 2006 Conference - Istanbul, Turkey (2006.07.8-2006.07.13)] 2006 Technology Management for the Global Future - PICMET 2006 Conference - Managing Internationalization through Innovation: A Viewpoint from a Developing Country
Estrada, Salvador, Heijs, JoostYear:
2006
DOI:
10.1109/picmet.2006.296625
File:
PDF, 17.54 MB
2006