[IEEE 2008 International SoC Design Conference (ISOCC) -...

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[IEEE 2008 International SoC Design Conference (ISOCC) - Busan, Korea (South) (2008.11.24-2008.11.25)] 2008 International SoC Design Conference - DFM optimization of standard cells considering random and systematic defect

Daehyun Jang,, Naya Ha,, Park, Joo-Hyun, Seung-Weon Paek,, Hyo-Sig Won,, Kyu-Myung Choi,
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Year:
2008
DOI:
10.1109/socdc.2008.4815575
File:
PDF, 111 KB
2008
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