[IEEE 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Chicago, IL, USA (2015.10.25-2015.10.30)] 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - ParkAnalyzer: Characterizing the movement patterns of visitors VAST 2015 Mini-Challenge 1
Jieqiong Zhao,, Wang, Guizhen, Chae, Junghoon, Hanye Xu,, Siqaio Chen,, Hatton, William, Towers, Sherry, Gorantla, Mahesh Babu, Ahlbrand, Benjamin, Jiawei Zhang,, Malik, Abish, Ko, Sungahn, Ebert,Year:
2015
DOI:
10.1109/vast.2015.7347669
File:
PDF, 1.02 MB
2015