[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA,...

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[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - Panel: When will the cost of dependability end innovation in computer design?

Bertacco, Valeria
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Year:
2015
DOI:
10.1109/vts.2015.7116264
File:
PDF, 124 KB
2015
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