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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - New 3D high-accuracy optical coordinates measuring technique based on an infrared target and binocular stereo vision
Li, Jinjun, Lehmann, Peter H., Zhao, Hong, Fu, Qiang, Zhang, Pengfei, Zhou, XiangVolume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.824483
File:
PDF, 709 KB
english, 2009