SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Precise measurement of the length by means of DFB diode and femtosecond laser
Šmíd, Radek, Lehmann, Peter H., Číp, Ondřej, Lazar, Josef, Jezek, Jan, Ružička, BohdanVolume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.827577
File:
PDF, 1.31 MB
english, 2009