SPIE Proceedings [SPIE SPIE Europe Optical Metrology -...

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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Determination of thermal lens effect by white light interferometry

Önal Tayyar, Duygu, Lehmann, Peter H., Emir, Ahmet, Saraç, Zehra
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Volume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.827858
File:
PDF, 629 KB
english, 2009
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