SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Dynamic holographic interferometry for dilatation measurements in a vacuum-thermal environment
Thizy, C., Lehmann, Peter H., Barbier, C., Barzin, P., Tychon, I., Roose, S., Stockman, Y., Georges, M.Volume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.828153
File:
PDF, 3.48 MB
english, 2009