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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Visualization and Data Analysis 2010 - Techniques for precision-based visual analysis of projected data

Park, Jinah, Schreck, Tobias, von Landesberger, Tatiana, Hao, Ming C., Wong, Pak C., Bremm, Sebastian, Chen, Chaomei
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Volume:
7530
Year:
2010
Language:
english
DOI:
10.1117/12.838720
File:
PDF, 2.53 MB
english, 2010
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