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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration - Development and application of wedge-shaped probes in an ultrafast measurement system
Lan, Tian, Zhang, Xuping, Bock, Wojtek J., Chen, Siying, Li, Cuiling, Lu, Xuejun, Ming, Hai, Ni, GuoqiangVolume:
7509
Year:
2009
Language:
english
DOI:
10.1117/12.840144
File:
PDF, 423 KB
english, 2009