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SPIE Proceedings [SPIE Second International Conference on Digital Image Processing - Singapore, Singapore (Friday 26 February 2010)] Second International Conference on Digital Image Processing - Classification of cast iron based on graphite grain morphology using neural network approach
Pattan, Prakash C., Mytri, V. D., Hiremath, P. S.Volume:
7546
Year:
2010
Language:
english
DOI:
10.1117/12.853286
File:
PDF, 1.15 MB
english, 2010