SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Design and Testing IV - System tolerance analysis of dual-advantage spectrographic system based on coded aperture
Wang, Yongtian, Cheng, Liang, Gong, Xingzhi, Bentley, Julie, Du, Chunlei, Yu, Feihong, Tatsuno, Kimio, Urbach, Hendrik P.Volume:
7849
Year:
2010
Language:
english
DOI:
10.1117/12.871670
File:
PDF, 1.53 MB
english, 2010