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SPIE Proceedings [SPIE Seventh International Symposium on Precision Engineering Measurements and Instrumentation - Yunnan, China (Sunday 7 August 2011)] Seventh International Symposium on Precision Engineering Measurements and Instrumentation - Evaluation method for one-dimensional assembly yield based on Taguchi orthogonal experiment
Wen, Zejun, Fan, Kuang-Chao, Song, Man, Zhu, Zhengqiang, Zhou, Zhijin, Lu, Rong-Sheng, Yang, ShuyiVolume:
8321
Year:
2011
Language:
english
DOI:
10.1117/12.905244
File:
PDF, 256 KB
english, 2011