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Investigation of Ge/Si quantum dot structures using the methods of admittance spectroscopy
Satdarov, Vadim G., Voitsekhovskii, Alexander V., Kokhanenko, Andrey P., Lozovoy, Kirill A.Volume:
12
Year:
2015
Language:
english
Journal:
International Journal of Nanotechnology
DOI:
10.1504/ijnt.2015.067213
File:
PDF, 2.00 MB
english, 2015