Polarized Raman scattering and SEM combined full characterization of self-assembled nematic thin films
Srikantharajah, R., Gerstner, K., Romeis, S., Peukert, W.Year:
2016
Language:
english
Journal:
Nanoscale
DOI:
10.1039/C6NR01440B
File:
PDF, 3.59 MB
english, 2016