[IEEE 2003 American Control Conference - Denver, CO, USA (4-6 June 2003)] Proceedings of the 2003 American Control Conference, 2003. - An LMI approach to worst case analysis for fault detection observers
Jian Liu,, Jian Liang Wang,, Guang-Hong Yang,Volume:
4
Year:
2003
Language:
english
DOI:
10.1109/acc.2003.1243779
File:
PDF, 628 KB
english, 2003