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[IEEE IEEE Applied Power Conference and Exposition - San Diego, CA USA (1987.3.2-1987.3.6)] 1987 IEEE Applied Power Electronics conference and Exposition - Using CAE to check stress levels in power circuits
Crosby, BrianYear:
1987
Language:
english
DOI:
10.1109/apec.1987.7067148
File:
PDF, 955 KB
english, 1987