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[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - A New Scan Flip Flop Design to Eliminate Performance Penalty of Scan
Ahlawat, Satyadev, Tudu, Jaynarayan, Matrosova, Anzhela, Singh, VirendraYear:
2015
Language:
english
DOI:
10.1109/ats.2015.12
File:
PDF, 211 KB
english, 2015