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[IEEE 2008 IEEE/OES US/EU-Baltic International Symposium (BALTIC) - Tallinn (2008.05.27-2008.05.29)] 2008 IEEE/OES US/EU-Baltic International Symposium - Development of high resolution measuring systems
Paka, VadimYear:
2008
Language:
english
DOI:
10.1109/baltic.2008.4625552
File:
PDF, 766 KB
english, 2008