[IEEE 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Coronado, CA, USA (2014.9.28-2014.10.1)] 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Analysis of the local extraction method of base and thermal resistance of bipolar transistors
Setekera, Robert, Tiemeijer, Luuk, Kloosterman, Willy, van der Toorn, RamsesYear:
2014
Language:
english
DOI:
10.1109/bctm.2014.6981318
File:
PDF, 336 KB
english, 2014