[IEEE 2015 45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) - Rio de Janeiro, Brazil (2015.6.22-2015.6.25)] 2015 45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Fine-Grained Characterization of Faults Causing Long Latency Crashes in Programs
Li, Guanpeng, Lu, Qining, Pattabiraman, KarthikYear:
2015
Language:
english
DOI:
10.1109/dsn.2015.36
File:
PDF, 515 KB
english, 2015