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[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Reliability improvement of solder anisotropic conductive film (ACF) joints by controlling ACF polymer resin properties
Kim, Yoo-Sun, Kim, Seung-Ho, Shin, Jiwon, Paik, Kyung-WookYear:
2015
Language:
english
DOI:
10.1109/ectc.2015.7159845
File:
PDF, 1.34 MB
english, 2015